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Microelectronic Reliability Vol. I Test and Diagnostics (Artech House Materials Science Library) by Emiliano Pollino

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Published by Artech House Publishers .
Written in English


  • Electronics & Communications Engineering,
  • Reliability Engineering,
  • Semiconductors,
  • Technology & Industrial Arts,
  • Science/Mathematics,
  • Electronics - Semiconductors,
  • Microelectronics,
  • Technology / Electronics / Semiconductors,
  • Reliability

Book details:

Edition Notes

ContributionsEdward B. Hakim (Introduction)
The Physical Object
Number of Pages396
ID Numbers
Open LibraryOL8215059M
ISBN 100890062846
ISBN 109780890062845

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Microelectronic Reliability, Vol. 1: Reliability, Test and Diagnostics (Artech House Materials Science Library) (English and Italian Edition) [Hakim, Edward B., Hakim, Edward B., Hakim, Edward B.] on *FREE* shipping on qualifying offers. Microelectronic Reliability, Vol. 1: Reliability, Test and Diagnostics (Artech House Materials Science Library) (English and Italian Edition)Format: Hardcover. Read the latest articles of Microelectronics Reliability at , Elsevier’s leading platform of peer-reviewed scholarly literature. Microelectronics Reliability. Supports open access. Articles in press Latest issue Article collections All issues Submit your article. Search in this journal. All issues. — Volumes Microelectronics Reliability - Editorial Board. Editor-in-Chief Dr. M. Tahoori. Karlsruhe Institute of Technology, Institute of Computer Engineering, Chair of Dependable Nano Computing, Technologiefabrik Haid-und-Neu-Str. 7 Build. , 3rd floor, D, Karlsruhe, Germany, Fax: +

Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the. COVID Resources. Reliable information about the coronavirus (COVID) is available from the World Health Organization (current situation, international travel).Numerous and frequently-updated resource results are available from this ’s WebJunction has pulled together information and resources to assist library staff as they consider how to handle coronavirus. (though a book has to be really quite poor to receive less than four stars). Microelectronic Reliability Vol 2 Page 5/ Online Library Microelectronic Reliability Vol 2 Integrity Assessment And Assurance Integrity Microelectronic Reliability, Vol. 2: Integrity Assessment and Assurance (Artech. Microelectronic Circuits, Fourth Edition is an extensive revision of the classic text by Adel S. Sedra and K. C. Smith. The primary objective of this text remains the development of the student''s ability to analyze and design electronic circuits, both analog and digital, discrete andintegrated. Fundamental developments in modern technology, particularly the increased emphasis on integrated /5(7).

Bowles, “A survey of reliability prediction procedures for microelectronic devices”, IEEE Trans. Reliability, Mar, pp M. Kelly,Author: Pradeep Lall. Notes for Microelectronics Fabrication. This note covers the following topics: Semiconductor and Solid State Physics, Crystal Structure and Growth, Defects in Semiconductors and Internal Gettering, Silicon Dioxide and Thermal Oxidation, Current-Voltage Analysis, Thickness Measurement, Ultra Thin Oxides, Impurity Diffusion, Sheet Resistance and Diffusion Profiles, Electrical Characteristics of. Microelectronics Reliability: Physics-of-Failure Based Modeling and Lifetime Evaluation NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance Mark White Jet Propulsion Laboratory Pasadena, California Joseph B. Bernstein University of Maryland College Park, Maryland NASA WBS: Books shelved as microelectronics: Microelectronic Circuits by Adel S. Sedra, Design of Analog CMOS Integrated by Behzad Razavi, VLSI Design Methodology.